The unique Bruker Optics DigiTect ™ technology ensures ... the HYPERION series FTIR microscope at the left side exit beam, a bolometer detector at the left front, a fiber optics coupling at ...

high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) from Bruker is the clear choice. InSight 3DAFM provides the accuracy ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The SENTERRA II defines a new level of ...

The new Dimension FastScan Atomic Force Microscope (the world's fastest AFM) will enable you to scan once and get all the details you need. Contact Bruker today to see for yourself the difference ...